The Multi-Physics Utility^[1] is designed to be used in conjunction with any of RSoft's passive device simulation tools. It provides a convenient interface from which perturbations of the refractive index profile of a structure may be included in the simulation. These perturbations can be due to advanced physical processes in the material, such as electro-optic effects, thermo-optic effects, stress-optic effects (i.e. strain), and carrier-induced effects. All material parameters needed to describe these effects can be defined in RSoft's Material Library.

^{[1] The basic Multi-Physics Utility with electro-optic and thermo-optic effects is included with all passive device tools; the stress and carrier effects are offered as options that are licensed separately}

Change in refractive index, due to carrier effects, in a silicon ridge waveguide buried in SiO₂


X component of strain in a silicon ridge waveguide buried in SiO₂

Benefits

• Expands the power of all of RSoft's passive device simulation tools.
  
• Fully integrated into the RSoft CAD Environment.
  
  

Applications

• Electro-absoptive/electro-refractive modulators
  
• Thermo-optic switches
  
• Electrically biased modulators
  
• Birefringence in waveguides and fibers
  
• Stress effects caused by cooling during device fabrication
  
  

Features

• Fully integrated with all of RSoft's passive device simulation tools.
  
• Leverages RSoft's material library for all model parameters.
  
• Computes index perturbation by solving Poisson's equation (electro-optic effect), thermal equation (thermo-optic effect), stress-strain equation (stress effect), and by using LaserMOD to model carrier-based effects.
  
• Automated parametric studies and design optimization using MOST